Magnetic suspension balance. Gravimetric sorption in real-world conditions. Dual-sample testing, up to 400°C.
● High-power X-ray diffractometer.
● Desktop XRD combines high-power X-ray & photon-counting 2D array.
● Photon-counting detector delivers lab-grade XRD in minutes.
The Lattice Series redefines benchtop X-ray diffraction by combining high-power performance with compact design. Equipped with a powerful 600 W (Lattice Mini) or 1600 W X-ray source and a high-efficiency, direct-read 2D photon detector, the Lattice Series delivers exceptional data intensity and accuracy—making it ideal for demanding analytical environments.
Available in three configurations—Lattice Mini, Lattice Basic, and Lattice Pro—this series accommodates a wide range of technical and budgetary needs, from simple phase identification to complex in-situ studies. All models offer excellent signal-to-noise ratio and fast scan speeds, providing lab-grade data from a desktop system.
Whether you’re analyzing complex powders, crystalline materials, or conducting highthroughput measurements, the Lattice Series provides lab-grade results with speed, power, and precision—all in a desktop footprint.
• High-Power X-ray Source
Choose between 600 W or 1600 W configurations for high-intensity data collection and rapid scanning.
• 2D Photon Direct-Read Detector
A 256 × 256 pixel array captures sharp, high-resolution diffraction patterns with an excellent signal-to-noise ratio.
• Exceptional Angular Accuracy
Achieve step sizes as small as ±0.01° 2θ and ensure a consistent peak matching with standard reference materials.
• Flexible Goniometer Options
Theta–2Theta geometry for standard analysis (Mini & Basic) or Theta–Theta for enhanced sample stability (Pro).
• Fast, Reliable Scanning
Obtain full-spectrum data in minutes—ideal for routine QA and high-throughput labs.
• Compact Benchtop Design
Fits seamlessly into modern lab environments without sacrificing performance or requiring floor space.
• Expandable Functionality (Lattice Pro)
Supports advanced modules for residual stress testing, high-temperature stages, in-situ battery studies, and thin film analysis.
• User-Friendly Operation
Intuitive software and streamlined hardware design simplify training and daily use.
| Specification | Lattice Mini | Lattice Basic | Lattice Pro |
|---|---|---|---|
| Model | Lattice Mini | Lattice Basic | Lattice Pro |
| X-Ray Tube Power | 600 W | 1600 W | 1600 W |
| X-Ray Tube Target Material | Standard Cu target, Co optional | ||
| Theodolite | Theta / 2-theta, radius 158 mm | Theta / 2-theta, radius 170 mm | Theta / theta, radius 170 mm |
| Maximum Scanning Range | −3° to 156° | ||
| Theta Minimum Step Size | ±0.01° | ||
| Detector | Photon direct-read 2D array detector | ||
| Detector Energy Resolution | 0.2 | ||
| Volume & Weight | L 25.6 in (650 mm) × W 19.7 in (500 mm) × H 15.8 in (400 mm), 132 lbs (60 kg) | L 35.5 in (900 mm) × W 26.8 in (680 mm) × H 21.7 in (500 mm), 220 lbs (100 kg) | L 35.5 in (900 mm) × W 26.8 in (680 mm) × H 21.7 in (500 mm), 220 lbs (100 kg) |
| Sample Stage | Standard chip stage | ||
| Options | N/A | Five-bit injector; In situ battery test accessories | Five-bit injector; In situ battery test accessories; High-temp sample station (customizable up to RT–600°C / RT–1000°C); Residual stress fixture (custom); Film sample stage 2.4 in (60 mm) × 2.4 in (60 mm) |
| Miller Indices | XRD Peak Comparison | |||
|---|---|---|---|---|
| Miller Indices | Theoretical Peak Position | Measured Peak Position | Difference | |
| 012 | 25.579 | 25.577 | 0.0020 | |
| 104 | 35.153 | 35.150 | 0.0030 | |
| 116 | 57.497 | 57.497 | 0.0000 | |
| 10̅10 | 76.871 | 76.872 | 0.0010 | |
| 02̅10 | 88.997 | 88.996 | -0.0010 | |
| 01̅14 | 116.612 | 116.610 | -0.0020 | |
Comparison of Theoretical Peak Positions and Measured Peak Positions for Corundum Standard Sample
